The Measurement Uncertainty challenge for the future technological nodes production and developmentFOUCHER, J; FAURIE, P; FOUCHER, A.-L et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7272, issn 0277-786X, isbn 978-0-8194-7525-1 0-8194-7525-4, 72721K.1-72721K.9, 2Conference Paper

Partie III. 2. Individualisation et initiative de l'apprenant dans des environnements (et des dispositifs) d'apprentissage ouverts : Une experience d'autoformation guidée : Partie 3: Etude de situations d'apprentissage autonomisantes = Part III.2. Learner's individualization and initiative in open learning context : a guided self-formation experienceFOUCHER, A.-L.Etudes de linguistique appliquée. 1998, Vol 110, Num AVRJUN, pp 227-236, issn 0071-190XArticle

3D-AFM booster for mass-production Nanoimprint LithographyFOUCHER, A.-L; FOUCHER, J; LANDIS, S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7272, issn 0277-786X, isbn 978-0-8194-7525-1 0-8194-7525-4, 72722J.1-72722J.6, 2Conference Paper

The LER/LWR metrology challenge for advance process control through 3D-AFM and CD-SEMFAURIE, P; FOUCHER, J; FOUCHER, A.-L et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7520, issn 0277-786X, isbn 978-0-8194-7909-9 0-8194-7909-8, 75200F.1-75200F.9Conference Paper

In-line transmission electron microscopy for micro and nanotechnologies research and developmentDELAYE, V; ANDRIEU, F; AUSSENAC, F et al.Microelectronic engineering. 2008, Vol 85, Num 5-6, pp 1157-1161, issn 0167-9317, 5 p.Conference Paper